AZOM

History of FIB Sample Preparation for TEM Analysis

When thinking of celebrated technological innovations, it is perhaps rare that we consider the role of material scientists: the unsung heroes of advancement. Nonetheless, it is the great work of these ...
AZOM

Laser Ablation for Site-Specific TEM Sample Preparation in a FIB-SEM

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...
Michigan Technological University

FIB Form and Function 1

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
AZoNano

TEM Lamella Preparation: Combine Flexibility and Automation using the ZEISS Crossbeam FIB-SEM

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
AZoNano

Sample Characterization with High Current Plasma FIB-SEM

In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...