Accurate measurement results depend on regular microscope calibration to ensure consistency and reliability across scientific and industrial use.

He said using the lens makes the 3D microscope easier to use and less expensive to build. "Our suite of patents covers methods on how to calibrate the ETL, how to create all-in-focus 3D images quickly ...

Physicists in Leiden have built a microscope that can measure no fewer than four key properties of a material in a single scan, all with nanoscale precision. The instrument can even examine complete ...

Researchers have shown that expensive aberration-corrected microscopes are no longer required to achieve record-breaking microscopic resolution. Researchers at the University of Illinois at ...

A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...