The family of electron microscopy techniques have become staple methods for imaging nanoscale objects, including nanoparticles, viruses and proteins. The appeal of electron microscopy as a ...

Atomic force microscopy (AFM) is a very popular analysis tool for 3D surface topology visualization and other measurements on a wide range of materials at nanoscales ...

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...

In recent decades, the preparation of samples for transmission electron microscopes has transformed, thanks to the introduction of focused ion beam (FIB) instruments. Known as either single-beam or ...

Prepare samples by coating, drying, etching, milling, polishing, and sectioning. The Leica CPD 030 Critical Point Dryer is a critical point drying device for biological and industrial samples. It uses ...

Advances in simultaneous SEM imaging while FIB milling provide unmatched feedback for precision endpointing New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live ...

Selecting a clinical microscopy camera requires balancing sensitivity, resolution, and workflow compatibility for consistent ...

This article explores LIG’s SMAL lenses, including their design principles, manufacturing methods, and performance in ...

Staining enhances contrast in pathology microscopy, enabling clear visualization of tissue structures to support accurate ...